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Test Systems
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I/O
Acquisition
Data Collection
High speed deterministic I/O
collection is accomplished via the WMAIO driver and is available
for use with the WindowsNT and Windows 2000 workstation operating
systems. Over time, WMA has enabled support for a wide
variety of I/O collection hardware allowing for configurations
that fit any need. The WMAIO driver supports I/O collection
via the following methods:
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I/O
wired to Industry Pack (IP) Modules mounted on IP Carrier cards
residing in an ISA or PCI slot within the control PC |
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I/O
collected from VME based hardware, utilizing the enormous amount
of instrument grade I/O cards available for the VME bus
including the same IP Modules used in the PC only I/O collection
method |
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Timer/Counter
cards from Keithley Instruments, National Instruments, and
Systran |
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High
Speed I/O from UEI Highspeed DAQ cards - for use with NVH
collection and speed sensor analysis |
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Vehicle
specific I/O collection such as CAN, ODBII, ISO9141, Keyword
Protocol and J1850 |
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Various distributed I/O standards such as
AB-FlexIO, Profibus and Interbus-S |
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Physical and pseudo I/O from most commonly
used hard and soft PLC's from Allen-Bradley, Modicon, Siemens and GE |
All
I/O is synchronized to a system clock, typically at a 10
millisecond interval, or can be synchronized to an external
trigger. The system, on command, performs automatic slope
and offset calibration on all strain gage sensors. The
internal shut resistors in the pressure transducers and strain
gauges/loadcells are utilized for determining the span. Control
Ramps Control
Ramps are functions used to control actuators and devices on the
test stand , such as the drive motor and shifter mechanisms.
The control ramps can either control an output linearly over time
or perform a step change to an output.
Control
Ramps have these capabilities with or without feedback input
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Wait for the ramp to complete before returning control to the
caller |
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Return control immediately and perform the ramp in the
background |
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Wait for a previously started ramp before returning control |
Monitors Monitors
are tools which allow the test sequence program to watch for
specific I/O events. As with the control ramps the monitor
functions allow the test to wait for an event before continuing,
wait for an event in the background, or wait for a previously
active event. Multiple monitors can occur simultaneously and
the system saves a snapshot of all I/O when the monitor conditions
are met.
Some
available types of Monitors are
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Monitor Digital to turn on or off |
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Monitor an input to come between 2 set values |
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Monitor an input to go above or below a limit |
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Monitor an input to rise or drop a specific amount in a given
time frame |
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Monitor two inputs to cross |
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Monitor two inputs to rise |
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Monitor the delta between inputs |
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Monitor an input to settle with in a tolerance for a given
time |
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Monitor the slope of an input to go above or below a set
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Events Event
detection functions can be used to initiate asynchronous
independent scanning for analog limit crossing or digital change
of state. Event detection can be initiated from any part of
the test system. event detection occurs in background processing,
when the event occurs the appropriate components of the system are
notified and action can be taken. Typical events are fault
detection, drive over speeds and drive over torques.
Some
available types of Monitors are
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Monitor Digital to turn on or off |
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Monitor an input to come between 2 set values
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Specific Device Support
Need custom support for a
non-standard or proprietary device? WMA has successfully
written installed many custom interfaces for a wide variety of
devices. We have an extensive library of methods and tools
to interface to anything you desire.
Signal Analysis Support
Built into WMA's I/O acquisition
architecture are the following data collection and analysis
methods:
| Sweep
Buffer - The
WMA I/O system is capable of buffering and storing all
available physical I/O, pseudo I/O as well as internal ramp
and monitor states. This capability can be extremely
useful in debugging stand problems or trying to catch that
hard to duplicate error. This buffer is active during
all tests and can be saved manually or triggered to
automatically save under certain conditions. |
| History
Buffer -
The WMA I/O system always buffers a specific duration of
"history". This feature allows the Test
Sequence to monitor for signal characteristics as slope
change, average values, and previous peaks - and to react to
them in real-time. The use of the history buffers allows
for more accurate testing by eliminating the use of hard-coded
delays in a sequence. |
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Signal
Analysis:
Built into the WMA Test System are a wide variety of signal
analysis tools. These tools are designed to be used
real during testing to determine critical test data.
Sweep all I/O all of the Time:
All WMA Test Systems maintain a buffer of all of
the defined I/O. The sweep
buffer can be extremely useful for debugging hard to
repeat problems.
History Buffer Functions:
A wide variety of functions using immediate history
buffer information are available during the test for
standard analysis, such as max/min values and averaging.
Support for standard motion
control platforms:
Each installation of a Test System may require integration
with standard motion control systems by such vendors as
Allen Bradley, Siemens, Modicon and GE. WMA Test
Systems have built in interfaces to such products to allow
for seamless integration.
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