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Test Systems
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Included with each test system is licensing for 2 Engineering Toolkits. The Engineering Toolkit is a suite of applications designed to facilitate the management of a test station.
Test Sequence Development
Minimization of error is key to the design of the WMA Test Sequence development environment. Test Sequences are edited using a graphical tree format editor. The editor takes care of syntax checking and formatting the test sequence to be run. In addition, a powerful scripting language is available for special case programming.
Parameter Maintenance
A parameter editor is available for Test Point, Reject and Limit definition. Test parameters are created using WMA's unique "phrase text" methodology. This allows for a consistent, ordered approach to test record design. All parameter definitions are stored either locally on the test stand in an Access Database, or centrally located on a Server running Oracle or SQLServer (see WMA Data Warehousing page).
I/O Tag Definition
The Tag Definition Editor is used to define I/O points to the WMA Test/Verification system. Each system is supplied with a fixed amount of I/O. For example, a specific type of system may have 32 analog inputs, 9 analog outputs, 3 encoder speed inputs, 3 encoder position inputs, 72 digital outputs, 24 digital inputs, 100 calculated analog inputs, 48 calculated analog outputs. The amounts and types of physical I/O are configured by WMA when the system is sold. The user can use the Tag and Configuration Editor to associate names, ranges, units and calibration information with the physical I/O system. WMA tag configuration allows for easy “characterization” of I/O, examples of this include low pass filtering, polynomial calculation and table interpolation for flow meters.
Test Data Viewer
All test data saved during at test in saved in a test data record. Each test is stored in a file and can be viewed with the Test Data Viewer. This allows your users to quickly scan data collected during a test.
The sweep and trace viewer are plotting packages that display sampled I/O in a similar manner. See the I/O Acquisition page for details on the differences between a sweep and a trace. For general purposes, a sweep is a collection of ALL available I/O, plus various system states, a Trace is a collection of selected I/O points and can be saved at a much higher sampling rate.
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13796 Spring Street - Burton,
Ohio 44021 - (440) 834-8522 |
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